The high-resolution imaging capability of atomic force microscopy (AFM) can be extended to enable a wide range of characterization methods to study electrical, mechanical, thermal, and other ...
What is Electrostatic Force Microscopy? Electrostatic Force Microscopy (EFM) is a scanning probe microscopy technique that measures the electrostatic interactions between a conductive probe and a ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback